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Phys. Rev. Lett. 86, 3112–3115 (2001)

Frequency-Dependent Shot Noise in Long Disordered Superconductor–Normal-Metal–Superconductor Contacts

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K. E. Nagaev
Institute of Radioengineering and Electronics, Russian Academy of Sciences, Mokhovaya ulica 11, 103907 Moscow, Russia

Received 27 October 2000; published in the issue dated 2 April 2001

The shot noise in long diffusive superconductor–normal-metal–superconductor contacts is calculated using the semiclassical approach. At low frequencies and for purely elastic scattering, the voltage dependence of the noise is of the form SI = (4Δ+2eV)/3R. The electron-electron scattering suppresses the noise at small voltages resulting in vanishing noise yet infinite dSI/dV at V = 0. The distribution function of electrons consists of a series of steps, and the frequency dependence of noise exhibits peculiarities at ω = neV, ω = neV-2Δ, and ω = 2Δ-neV for integer n.

© 2001 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.86.3112
DOI:
10.1103/PhysRevLett.86.3112
PACS:
72.70.+m, 74.40.+k, 74.50.+r