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APS » Journals » Phys. Rev. Lett. » Volume 86 » Issue 8
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Phys. Rev. Lett. 86, 1538–1541 (2001)

Pairing Interactions and Gibbs Adsorption at the Liquid Bi-In Surface: A Resonant X-Ray Reflectivity Study

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E. DiMasi1,*, H. Tostmann2,†, O. G. Shpyrko2, P. Huber2, B. M. Ocko1, P. S. Pershan2, M. Deutsch3, and L. E. Berman4
1Department of Physics, Brookhaven National Laboratory, Upton, New York 11973
2Division of Engineering and Applied Sciences and Department of Physics, Harvard University, Cambridge, Massachusetts 02138
3Department of Physics, Bar-Ilan University, Ramat-Gan 52900, Israel
4National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11973

Received 2 August 2000; published in the issue dated 19 February 2001

Resonant x-ray reflectivity measurements from the surface of liquid Bi22In78 find only a modest surface Bi enhancement, with 35 at.% Bi in the first atomic layer. This is in contrast to the Gibbs adsorption in all liquid alloys studied to date, which show surface segregation of a complete monolayer of the low surface tension component. This suggests that surface adsorption in Bi-In is dominated by attractive interactions that increase the number of Bi-In neighbors at the surface. These are the first measurements in which resonant x-ray scattering has been used to quantify compositional changes induced at a liquid alloy surface.

© 2001 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.86.1538
DOI:
10.1103/PhysRevLett.86.1538
PACS:
61.25.-f, 61.10.-i, 68.03.-g

*Author to whom correspondence should be addressed. Electronic address: dimasi@bnl.gov

†Present address: Department of Chemistry, University of Florida, Gainesville, Florida 32611.

 
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