Phys. Rev. Lett. 87, 140801 (2001) [4 pages]Characterization of the Transverse Coherence of Hard Synchrotron Radiation by Intensity InterferometryReceived 20 June 2001; published 14 September 2001 The transverse coherence of x rays was measured with an intensity interferometer using a 120-μeV-bandwidth monochromator operating at 14.41 keV. By analyzing the transverse coherence profiles, a vertical source profile of a 25-m long undulator of SPring-8, as well as the coherence degradation by a phase object in the beam path, were quantitatively characterized. © 2001 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevLett.87.140801
DOI:
10.1103/PhysRevLett.87.140801
PACS:
07.85.Qe, 41.50.+h, 42.50.-p
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