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Phys. Rev. Lett. 88, 038301 (2002) [4 pages]

Young's Interference of Electrons in Field Emission Patterns

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C. Oshima, K. Mastuda, T. Kona, Y. Mogami, M. Komaki, Y. Murata, and T. Yamashita
Department of Applied Physics, Waseda University, 3-4-1 Okubo, Shinjyuku-ku, Tokyo 169-8555, JapanKagami Memorial Laboratory for Material Science and Technology, Waseda University, 2-8-26 Nishiwaseda, Shinjyuku-ku, Tokyo 169-0051, Japan

T. Kuzumaki and Y. Horiike
Department of Materials Science, Graduate School of Engineering, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656, Japan

Received 9 April 2001; published 4 January 2002

We have observed interference fringes of electrons in field emission patterns from multiwalled carbon nanotubes at 60 K. The observed fringe pattern is reproduced by calculations based on the formula of Young's interference of two beams. Three-beam interference has also been detected over short time periods. We discuss the reason why Young's interference appears in the electron emission pattern in accelerating fields.

© 2002 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.88.038301
DOI:
10.1103/PhysRevLett.88.038301
PACS:
85.35.Kt, 68.37.Vj, 79.70.+q, 81.05.Uw
 
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