Phys. Rev. Lett. 88, 057201 (2002) [4 pages]Spin-Polarized Scanning Tunneling Microscopy with Antiferromagnetic Probe TipsReceived 10 July 2001; published 18 January 2002 We have performed low temperature spin-polarized scanning tunneling microscopy (SP-STM) of two monolayers Fe on W(110) using tungsten tips coated with different magnetic materials. We observe stripe domains with a magnetic period of 50±5nm. Employing Cr as a coating material we recorded SP-STM images with an antiferromagnetic probe tip. The advantage of its vanishing dipole field is most apparent in external magnetic fields. This new approach resolves the problem of the disturbing influence of a ferromagnetic tip in the investigation of soft magnetic materials and superparamagnetic particles. © 2002 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevLett.88.057201
DOI:
10.1103/PhysRevLett.88.057201
PACS:
75.70.Ak, 07.79.-v, 75.60.Ch
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