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Phys. Rev. Lett. 88, 077401 (2002) [4 pages]

Electron Correlation Effects in Resonant Inelastic X-Ray Scattering of NaV2O5

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G. P. Zhang1,2, T. A. Callcott1, G. T. Woods1, and L. Lin1
1Department of Physics and Astronomy, The University of Tennessee, Knoxville, Tennessee 37996-1200
2Department of Physics, State University of New York, College at Buffalo, New York 14222

Brian Sales, D. Mandrus, and J. He
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831

See Also: Erratum

Received 25 April 2001; published 31 January 2002

Element- and site-specific resonant inelastic x-ray scattering spectroscopy (RIXS) is employed to investigate electron correlation effects in NaV2O5. In contrast to single photon techniques, RIXS at the vanadium L3 edge is able to probe d-d* transitions between V d-bands. A sharp energy loss feature is observed at -1.56eV, which is well reproduced by a model calculation including correlation effects. The calculation identifies the loss feature as excitation between the lower and upper Hubbard bands and permits an accurate determination of the Hubbard interaction term U = 3.0±0.2eV.

© 2002 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.88.077401
DOI:
10.1103/PhysRevLett.88.077401
PACS:
78.70.En, 71.27.+a, 71.28.+d

See Also

Comment: Michel van Veenendaal and A. J. Fedro, Comment on “Electron Correlation Effects in Resonant Inelastic X-ray Scattering of NaV2O5, Phys. Rev. Lett. 92, 219701 (2004).

Comment: L.-C. Duda, T. Schmitt, J. Nordgren, P. Kuiper, G. Dhalenne, and A. Revcolevschi, Low-Energy Excitations in Resonant Inelastic X-Ray Scattering of α-NaV2O5, Phys. Rev. Lett. 93, 169701 (2004).

Erratum: G. P. Zhang, T. A. Callcott, G. T. Woods, L. Lin, Brian Sales, D. Mandrus, and J. He, Erratum: Electron Correlation Effects in Resonant Inelastic X-Ray Scattering of NaV2O5 [Phys. Rev. Lett. 88, 077401 (2002)], Phys. Rev. Lett. 88, 189902 (2002).

Reply: G. P. Zhang, T. A. Callcott, G. T. Woods, L. Lin, Brian Sales, D. Mandrus, and J. He, Zhang et al. Reply:, Phys. Rev. Lett. 92, 219702 (2004).

Reply: G. P. Zhang, T. A. Callcott, G. T. Woods, L. Lin, Brian Sales, D. Mandrus, and J. He, Zhang et al. Reply:, Phys. Rev. Lett. 93, 169702 (2004).