Phys. Rev. Lett. 88, 077401 (2002) [4 pages]Electron Correlation Effects in Resonant Inelastic X-Ray Scattering of NaV2O5See Also: Erratum Received 25 April 2001; published 31 January 2002 Element- and site-specific resonant inelastic x-ray scattering spectroscopy (RIXS) is employed to investigate electron correlation effects in NaV2O5. In contrast to single photon techniques, RIXS at the vanadium L3 edge is able to probe d-d* transitions between V d-bands. A sharp energy loss feature is observed at -1.56eV, which is well reproduced by a model calculation including correlation effects. The calculation identifies the loss feature as excitation between the lower and upper Hubbard bands and permits an accurate determination of the Hubbard interaction term U = 3.0±0.2eV. © 2002 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevLett.88.077401
DOI:
10.1103/PhysRevLett.88.077401
PACS:
78.70.En, 71.27.+a, 71.28.+d
See AlsoComment: Michel van Veenendaal and A. J. Fedro, Comment on “Electron Correlation Effects in Resonant Inelastic X-ray Scattering of NaV2O5”, Phys. Rev. Lett. 92, 219701 (2004). Comment: L.-C. Duda, T. Schmitt, J. Nordgren, P. Kuiper, G. Dhalenne, and A. Revcolevschi, Low-Energy Excitations in Resonant Inelastic X-Ray Scattering of α′-NaV2O5, Phys. Rev. Lett. 93, 169701 (2004). Erratum: G. P. Zhang, T. A. Callcott, G. T. Woods, L. Lin, Brian Sales, D. Mandrus, and J. He, Erratum: Electron Correlation Effects in Resonant Inelastic X-Ray Scattering of NaV2O5 [Phys. Rev. Lett. 88, 077401 (2002)], Phys. Rev. Lett. 88, 189902 (2002). Reply: G. P. Zhang, T. A. Callcott, G. T. Woods, L. Lin, Brian Sales, D. Mandrus, and J. He, Zhang et al. Reply:, Phys. Rev. Lett. 92, 219702 (2004). Reply: G. P. Zhang, T. A. Callcott, G. T. Woods, L. Lin, Brian Sales, D. Mandrus, and J. He, Zhang et al. Reply:, Phys. Rev. Lett. 93, 169702 (2004). |
