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Phys. Rev. Lett. 89, 088303 (2002) [4 pages]

High Resolution 3D X-Ray Diffraction Microscopy

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Jianwei Miao1,*, Tetsuya Ishikawa2, Bart Johnson1, Erik H. Anderson3, Barry Lai4, and Keith O. Hodgson1,5
1Stanford Synchrotron Radiation Laboratory, Stanford Linear Accelerator Center, Stanford University, Stanford, California 94309-0210
2SPring-8/RIKEN, 1-1-1 Kouto, Mikazuki, Sayo-gun, Hyogo 679-5148, Japan
3Center for X-ray Optics, Lawrence Berkeley National Laboratory, Berkeley, California 94720
4Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439
5Department of Chemistry, Stanford University, Stanford, California 94305

Received 15 April 2002; published 6 August 2002

See accompanying Physics Focus

We have imaged a 2D buried Ni nanostructure at 8 nm resolution using coherent x-ray diffraction and the oversampling phasing method. By employing a 3D imaging reconstruction algorithm, for the first time we have experimentally determined the 3D structure of a noncrystalline nanostructured material at 50 nm resolution. The 2D and 3D imaging resolution is currently limited by the exposure time and the computing power, while the ultimate resolution is limited by the x-ray wavelengths. We believe these results pave the way for the development of atomic resolution 3D x-ray diffraction microscopy.

© 2002 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.89.088303
DOI:
10.1103/PhysRevLett.89.088303
PACS:
81.07.Bc, 42.30.Rx, 42.30.Wb, 61.10.Dp

*Corresponding author.

Email address: miao@ssrl.slac.stanford.edu

 
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