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Phys. Rev. Lett. 90, 013904 (2003) [4 pages]

X-Ray Interferometry with Microelectronvolt Resolution

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Yu. V. Shvyd’ko*, M. Lerche, H.-C. Wille, E. Gerdau, M. Lucht, and H. D. Rüter
Institut für Experimentalphysik, Universität Hamburg, D-22761 Germany

E. E. Alp and R. Khachatryan
Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439

Received 5 August 2002; published 10 January 2003

We demonstrate an interferometer for hard x rays with two back-reflecting sapphire crystal mirrors—a prototype x-ray Fabry-Pérot interferometer. A finesse of 15 and 0.76  μeV broad Fabry-Pérot transmission resonances are measured by the time response of the interferometer. Interference patterns are observed directly in spectral dependences of reflectivity.

© 2003 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.90.013904
DOI:
10.1103/PhysRevLett.90.013904
PACS:
42.25.–p, 07.60.Ly, 41.50.+h, 61.10.–i

*Electronic address: Yuri.Shvydko@desy.de

 
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