Phys. Rev. Lett. 90, 175502 (2003) [4 pages]Quasistatic X-Ray Speckle Metrology of Microscopic Magnetic Return-Point MemoryReceived 11 July 2002; published 30 April 2003 We have used coherent, resonant, x-ray magnetic speckle patterns to measure the statistical evolution of the microscopic magnetic domains in perpendicular magnetic films as a function of the applied magnetic field. Our work constitutes the first direct, ensemble-averaged study of microscopic magnetic return-point memory, and demonstrates the profound impact of interfacial roughness on this phenomenon. At low fields, the microscopic magnetic domains forget their past history with an exponential field dependence. © 2003 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevLett.90.175502
DOI:
10.1103/PhysRevLett.90.175502
PACS:
61.10.–i, 07.85.Qe, 75.60.Ej, 78.70.Dm
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