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Phys. Rev. Lett. 90, 185503 (2003) [4 pages]

X-Ray Scattering from Freestanding Polymer Films with Geometrically Curved Surfaces

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D. R. Lee1, K. Shin2, O. H. Seeck3, Hyunjung Kim4, Y.-S. Seo5, M. Tolan6, M. H. Rafailovich5, J. Sokolov5, and S. K. Sinha7
1Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA
2Department of Material Science and Engineering, Kwangju Institute of Science and Technology, Kwangju 500-712, Korea
3IFF, FZ Jülich GmbH, 52425 Jülich, Germany
4Department of Physics, Sogang University, Seoul 121-742, Korea
5Department of Materials Science and Engineering, State University of New York, Stony Brook, New York 11794, USA
6University of Dortmund, Experimentelle Physik I, D-44221 Dortmund, Germany
7Department of Physics, University of California, San Diego, La Jolla, California 92093, USA, and Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA

Received 30 November 2002; published 8 May 2003

We show that the x-ray surface scattering from a freestanding polymer film exhibits features that cannot be explained by the usual stochastic formalism for surfaces with random height fluctuations. Instead, a geometric description of the film morphology assuming two curved surfaces characterized by a radius of curvature and a lateral cutoff length successfully accounts for the phase difference between the Kiessig fringes of the nominal “specular” and “off-specular” components of the scattering. The formalism allows one to distinguish unambiguously between conformal and anticonformal curvature morphologies at long length scales.

© 2003 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.90.185503
DOI:
10.1103/PhysRevLett.90.185503
PACS:
61.10.Kw, 68.47.Mn, 68.55.Jk
 
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