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Phys. Rev. Lett. 90, 227601 (2003) [4 pages]

Localized Ferromagnetic Resonance in Inhomogeneous Thin Films

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R. D. McMichael and D. J. Twisselmann
National Institute of Standards & Technology, Gaithersburg, Maryland 20899, USA

Andrew Kunz
Physics Department, Lawrence University, Appleton Wisconsin 54912, USA

Received 23 December 2002; published 3 June 2003

The effect of sample inhomogeneity on the ferromagnetic resonance linewidth is determined by diagonalization of a spin wave Hamiltonian for ferromagnetic thin films with inhomogeneities spanning a wide range of characteristic length scales. A model inhomogeneity is used that consists of size D grains and an anisotropy field Hp that varies randomly from grain to grain in a film with thickness d and magnetization Ms. The resulting linewidth agrees well with the two-magnon model for small inhomogeneity, HpDπMsd. For large inhomogeneity, HpDπMsd, the precession becomes localized and the spectrum approaches that of local precession on independent grains.

© 2003 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.90.227601
DOI:
10.1103/PhysRevLett.90.227601
PACS:
76.50.+g, 75.40.Gb, 75.40.Mg