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APS » Journals » Phys. Rev. Lett. » Volume 90 » Issue 9
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Phys. Rev. Lett. 90, 095503 (2003) [4 pages]

High-Resolution Near-Field Raman Microscopy of Single-Walled Carbon Nanotubes

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Achim Hartschuh1, Erik J. Sánchez2, X. Sunney Xie3, and Lukas Novotny1
1The Institute of Optics, University of Rochester, Rochester, New York 14627
2Department of Physics, Portland State University, Portland, Oregon 97207
3Department of Chemistry and Chemical Biology, Harvard University, Cambridge, Massachusetts 02138

Received 9 August 2002; published 4 March 2003

We present near-field Raman spectroscopy and imaging of single isolated single-walled carbon nanotubes with a spatial resolution of ≈25  nm. The near-field origin of the image contrast is confirmed by the measured dependence of the Raman scattering signal on tip-sample distance and the unique polarization properties. The method is used to study local variations in the Raman spectrum along a single single-walled carbon nanotube.

© 2003 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.90.095503
DOI:
10.1103/PhysRevLett.90.095503
PACS:
61.46.+w, 07.79.–v, 78.30.Na, 78.67.Ch
 
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