corner
corner

Phys. Rev. Lett. 91, 204801 (2003) [4 pages]

Focusing X-Ray Beams to Nanometer Dimensions

Download: PDF (242 kB) Buy this article Export: BibTeX or EndNote (RIS)

C. Bergemann1,*, H. Keymeulen2, and J. F. van der Veen2
1Laboratorium für Festkörperphysik, ETH-Hönggerberg, CH-8093 Zürich, Switzerland
2Paul Scherrer Institut, CH-5232 Villigen, Switzerland and ETH-Zürich, Zürich, Switzerland

Received 27 June 2003; published 10 November 2003

We address the question: what is the smallest spot size to which an x-ray beam can be focused? We show that confinement of the beam within a narrowly tapered waveguide leads to a theoretical minimum beam size of the order of 10 nm (FWHM), the exact value depending only on the electron density of the confining material. This limit appears to apply to all x-ray focusing devices. Mode mixing and interference can help to achieve this spot size without the need for ultrasmall apertures.

© 2003 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.91.204801
DOI:
10.1103/PhysRevLett.91.204801
PACS:
41.50.+h, 07.85.Qe, 61.10.–i

*Present address: Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge CB3 0HE, United Kingdom.