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Phys. Rev. Lett. 91, 216601 (2003) [4 pages]

Unification of the Hole Transport in Polymeric Field-Effect Transistors and Light-Emitting Diodes

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C. Tanase1, E. J. Meijer2,3, P. W. M. Blom1, and D. M. de Leeuw2
1Materials Science Centre and DPI, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands
2Philips Research Laboratories, 5656 AA Eindhoven, The Netherlands
3Delft University of Technology, Faculty of Applied Sciences, Department of NanoScience, Lorentzweg 1, 2628 CJ Delft, The Netherlands

Received 26 February 2003; published 19 November 2003

A systematic study of the hole mobility in hole-only diodes and field-effect transistors based on poly(2-methoxy-5-(3,7-dimethyloctyloxy)-p-phenylene vinylene) and on amorphous poly(3-hexyl thiophene) has been performed as a function of temperature and applied bias. The experimental hole mobilities extracted from both types of devices, although based on a single polymeric semiconductor, can differ by 3 orders of magnitude. We demonstrate that this apparent discrepancy originates from the strong dependence of the hole mobility on the charge carrier density in disordered semiconducting polymers.

© 2003 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.91.216601
DOI:
10.1103/PhysRevLett.91.216601
PACS:
72.80.Le, 73.61.Ph