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APS » Journals » Phys. Rev. Lett. » Volume 92 » Issue 13
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Phys. Rev. Lett. 92, 135507 (2004) [4 pages]

Pseudomorphic Growth of a Single Element Quasiperiodic Ultrathin Film on a Quasicrystal Substrate

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J. Ledieu, J. T. Hoeft, D. E. Reid, and J. A. Smerdon
Surface Science Research Centre, The University of Liverpool, Liverpool L69 3BX, United Kingdom

R. D. Diehl
Department of Physics, Pennsylvania State University, University Park, Pennsylvania 16802, USA

T. A. Lograsso and A. R. Ross
Ames Laboratory, Iowa State University, Ames, Iowa 50011, USA

R. McGrath*
Surface Science Research Centre and Department of Physics, The University of Liverpool, Liverpool L69 3BX, United Kingdom

Received 1 October 2003; published 2 April 2004

An ultrathin film with a periodic interlayer spacing was grown by the deposition of Cu atoms on the fivefold surface of the icosahedral Al70Pd21Mn9 quasicrystal. For coverages from 5 to 25 monolayers, a distinctive quasiperiodic low-energy electron diffraction pattern is observed. Scanning tunneling microscopy images show that the in-plane structure comprises rows having separations of S=4.5±0.2  Å and L=7.3±0.3  Å, whose ratio equals τ=1.618… within experimental error. The sequences of such row separations form segments of terms of the Fibonacci sequence, indicative of the formation of a pseudomorphic Cu film.

© 2004 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.92.135507
DOI:
10.1103/PhysRevLett.92.135507
PACS:
61.44.Br, 61.14.Hg, 68.35.Bs, 68.37.Ef

*Corresponding author.

Electronic address: mcgrath@liv.ac.uk

 
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