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Phys. Rev. Lett. 92, 157005 (2004) [4 pages]

Nodal Order Parameter in Electron-Doped Pr2-xCexCuO4-δ Superconducting Films

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A. Snezhko and R. Prozorov
Department of Physics & Astronomy and NanoCenter, University of South Carolina, 712 Main Street, Columbia, South Carolina 29208, USA

D. D. Lawrie and R. W. Giannetta
Loomis Laboratory of Physics, University of Illinois at Urbana-Champaign, 1110 West Green Street, Urbana, Illinois 61801, USA

J. Gauthier, J. Renaud, and P. Fournier
Centre de Recherche sur les Propriétés Électroniques de Matériaux Avancés, Département de Physique, Université de Sherbrooke, Sherbrooke, Québec, Canada J1K 2R1

Received 10 April 2003; published 16 April 2004

The London penetration depth, λab(T), is reported for thin films of the electron-doped superconductor Pr2-xCexCuO4-δ with varying Ce concentration, x=0.13, 0.15, and 0.17. Measurements down to 0.35 K were carried out using a tunnel-diode oscillator with excitation fields applied both perpendicular and parallel to the conducting planes. Films at all three doping levels exhibited power law behavior indicative of d-wave pairing with impurity scattering. These results are fully consistent with previous measurements on single crystals.

© 2004 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.92.157005
DOI:
10.1103/PhysRevLett.92.157005
PACS:
74.25.Nf, 74.72.Jt
 
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