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Phys. Rev. Lett. 92, 216101 (2004) [4 pages]

Semiconducting Surface Reconstructions of p-Type Si(100) Substrates at 5 K

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L. Perdigão, D. Deresmes, B. Grandidier*, M. Dubois, C. Delerue, G. Allan, and D. Stiévenard
Institut d’Electronique, de Microélectronique et de Nanotechnologie, IEMN (CNRS, UMR 8520), Département ISEN, 41 bd Vauban, 59046 Lille Cedex, France

Received 6 October 2003; published 27 May 2004

We report scanning tunneling microscopy (STM) studies of the technologically important Si(100) surface that reveal at 5 K the coexistence of stable surface domains consisting of the p(2×1) reconstruction along with the c(4×2) and p(2×2) reconstructions. Using highly resolved tunneling spectroscopic measurements and tight binding calculations, we prove that the p(2×1) reconstruction is asymmetric and determine the mechanism that enables the contrast variation observed in the formation of the bias-dependent STM images for this reconstruction.

© 2004 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.92.216101
DOI:
10.1103/PhysRevLett.92.216101
PACS:
68.35.Bs, 68.37.Ef

*Electronic address: bruno.grandidier@isen.iemn.univ-lille1.fr