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APS » Journals » Phys. Rev. Lett. » Volume 93 » Issue 11
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Phys. Rev. Lett. 93, 114802 (2004) [4 pages]

Electro-Optic Technique with Improved Time Resolution for Real-Time, Nondestructive, Single-Shot Measurements of Femtosecond Electron Bunch Profiles

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G. Berden1, S. P. Jamison2,*, A. M. MacLeod2, W. A. Gillespie2, B. Redlich1, and A. F. G. van der Meer1
1FOM Institute for Plasma Physics “Rijnhuizen,” Edisonbaan 14, 3439 MN Nieuwegein, The Netherlands
2School of Computing and Advanced Technologies, University of Abertay Dundee, Bell Street, Dundee DD1 1HG, United Kingdom

Received 22 April 2004; published 9 September 2004

Electro-optic detection of the Coulomb field of a relativistic electron bunch combined with single-shot cross correlation of optical pulses is used to enable single-shot measurements of the shape and length of femtosecond electron bunches. This method overcomes a fundamental time-resolution limit of previous single-shot electro-optic measurements, which arises from the inseparability of time and frequency properties of the probing optical pulse. Using this new technique we have made real-time measurements of a 50 MeV electron bunch, observing the profile of 650 fs FWHM (∼275  fs rms) long bunches.

© 2004 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.93.114802
DOI:
10.1103/PhysRevLett.93.114802
PACS:
41.75.Ht, 41.60.Cr, 41.85.Ew, 42.65.Re

*Corresponding author.

Present address: Department of Physics, University of Strathclyde, Glasgow, U.K.

 
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