Phys. Rev. Lett. 93, 116104 (2004) [4 pages]Microscopic View of Charge Injection in an Organic SemiconductorReceived 18 May 2004; published 10 September 2004 We have measured the chemical potential and capacitance in a disordered organic semiconductor by electric force microscopy, following the electric field and interfacial charge density microscopically as the semiconductor undergoes a transition from Ohmic to space-charge limited conduction. Electric field and charge density at the metal-organic interface are inferred from the chemical potential and current. The charge density at this interface increases with electric field much faster than is predicted by the standard diffusion-limited thermionic emission theories. © 2004 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevLett.93.116104
DOI:
10.1103/PhysRevLett.93.116104
PACS:
68.37.–d, 73.30.+y, 73.61.Jc, 73.61.Ph
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