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Phys. Rev. Lett. 94, 023004 (2005) [4 pages]

Deceleration and Electrostatic Trapping of OH Radicals

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Sebastiaan Y. T. van de Meerakker1,2, Paul H. M. Smeets2, Nicolas Vanhaecke1, Rienk T. Jongma3, and Gerard Meijer1
1Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, 14195 Berlin, Germany
2FOM-Institute for Plasmaphysics Rijnhuizen, Edisonbaan 14, 3439 MN Nieuwegein, The Netherlands
3Space Research Organization Netherlands, Sorbonnelaan 2, 3584 CA Utrecht, The Netherlands

Received 22 July 2004; published 18 January 2005

A pulsed beam of ground state OH radicals is slowed down using a Stark decelerator and is subsequently loaded into an electrostatic trap. Characterization of the molecular beam production, deceleration, and trap loading process is performed via laser induced fluorescence detection inside the quadrupole trap. Depending on the details of the trap loading sequence, typically 105 OH (X2Π3/2,J=3/2) radicals are trapped at a density of around 107  cm-3 and at temperatures in the 50–500 mK range. The 1/e trap lifetime is around 1.0 s.

© 2005 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.94.023004
DOI:
10.1103/PhysRevLett.94.023004
PACS:
33.80.Ps, 33.55.Be, 39.10.+j