Phys. Rev. Lett. 95, 156401 (2005) [4 pages]Self-Trapped Excitons in Silicon Dioxide: Mechanism and PropertiesReceived 10 June 2005; published 6 October 2005 Irradiating silica produces self-trapped excitons (STEs) that spontaneously create atomic-scale distortions on which they localize themselves. Despite enduring interest in STEs and subsequent defects in this key technological material, the trapping mechanism and geometry remain a mystery. Our ab initio study of STEs in α-quartz using a many-electron Green’s function approach answers both questions. The STE comprises a broken O-Si bond with the hole localized on the defected oxygen and the electron on the defected silicon atom in a planar sp2 conformation. The results further explain quantitatively the measured STE spectra. © 2005 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevLett.95.156401
DOI:
10.1103/PhysRevLett.95.156401
PACS:
71.15.Qe, 71.35.Aa, 71.35.Cc, 71.55.Ht
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