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Phys. Rev. Lett. 95, 156401 (2005) [4 pages]

Self-Trapped Excitons in Silicon Dioxide: Mechanism and Properties

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Sohrab Ismail-Beigi1 and Steven G. Louie2
1Department of Applied Physics, Yale University, New Haven, Connecticut 06520, USA
2Department of Physics, University of California, and Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA

Received 10 June 2005; published 6 October 2005

Irradiating silica produces self-trapped excitons (STEs) that spontaneously create atomic-scale distortions on which they localize themselves. Despite enduring interest in STEs and subsequent defects in this key technological material, the trapping mechanism and geometry remain a mystery. Our ab initio study of STEs in α-quartz using a many-electron Green’s function approach answers both questions. The STE comprises a broken O-Si bond with the hole localized on the defected oxygen and the electron on the defected silicon atom in a planar sp2 conformation. The results further explain quantitatively the measured STE spectra.

© 2005 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.95.156401
DOI:
10.1103/PhysRevLett.95.156401
PACS:
71.15.Qe, 71.35.Aa, 71.35.Cc, 71.55.Ht