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Phys. Rev. Lett. 95, 166105 (2005) [4 pages]

Twin Boundaries Can Be Moved by Step Edges During Film Growth

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W. L. Ling, N. C. Bartelt, and K. F. McCarty
Sandia National Laboratories, Livermore, California 94550, USA

C. B. Carter
University of Minnesota, Minneapolis, Minnesota 55455, USA

Received 20 May 2005; published 13 October 2005

We track individual twin boundaries in Ag films on Ru(0001) using low-energy electron microscopy. The twin boundaries, which separate film regions whose close-packed planes are stacked differently, move readily during film growth but relatively little during annealing. The growth-driven motion of twin boundaries occurs as film steps advance across the surface—as a new atomic Ag layer reaches an fcc twin boundary, the advancing step edge carries along the boundary. This coupling of the microstructural defect (twin boundary) and the surface step during growth can produce film regions over 10  μm wide that are twin free.

© 2005 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.95.166105
DOI:
10.1103/PhysRevLett.95.166105
PACS:
68.55.Jk, 61.72.Ff, 68.37.Nq, 68.60.Dv