Phys. Rev. Lett. 95, 197402 (2005) [4 pages]Localized Electronic Excitations in NiO Studied with Resonant Inelastic X-Ray Scattering at the Ni M Threshold: Evidence of Spin FlipReceived 24 February 2005; published 31 October 2005 We studied the neutral electronic excitations of NiO localized at the Ni sites by measuring the resonant inelastic x-ray scattering (RIXS) spectra at the Ni M2,3 edges. The good energy resolution allows an unambiguous identification of several spectral features due to dd excitations. The dependence of the RIXS spectra on the excitation energy gives evidence of local spin flip and yields a value of 125±15 meV for the antiferromagnetic exchange interaction. Accurate crystal field parameters are also obtained. © 2005 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevLett.95.197402
DOI:
10.1103/PhysRevLett.95.197402
PACS:
78.70.Ck, 71.27.+a, 75.30.Et, 78.70.Dm
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