Phys. Rev. Lett. 95, 237602 (2005) [4 pages]Polarization Relaxation Induced by a Depolarization Field in Ultrathin Ferroelectric BaTiO3 CapacitorsReceived 21 June 2005; published 1 December 2005 Time-dependent polarization relaxation behavior induced by a depolarization field Ed was investigated on high-quality ultrathin SrRuO3/BaTiO3/SrRuO3 capacitors. The Ed values were determined experimentally from an applied external field to stop the net polarization relaxation. These values agree with those from the electrostatic calculations, demonstrating that a large Ed inside the ultrathin ferroelectric layer could cause severe polarization relaxation. For numerous ferroelectric devices of capacitor configuration, this effect will set a stricter size limit than the critical thickness issue. © 2005 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevLett.95.237602
DOI:
10.1103/PhysRevLett.95.237602
PACS:
77.22.Ej, 77.22.Gm, 77.55.+f, 77.80.Dj
|
|
About | Terms and Conditions | Subscriptions | Search | Help
Use of the American Physical Society websites and journals implies that the user has read and agrees to our Terms and Conditions and any applicable Subscription Agreement. Physical Review®, Physical Review Letters®, Reviews of Modern Physics®, and Physical Review Special Topics® are trademarks of the American Physical Society.