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APS » Journals » Phys. Rev. Lett. » Volume 95 » Issue 6
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Phys. Rev. Lett. 95, 067405 (2005) [4 pages]

Band-Selective Measurements of Electron Dynamics in VO2 Using Femtosecond Near-Edge X-Ray Absorption

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A. Cavalleri1,*, M. Rini1, H. H. W. Chong1, S. Fourmaux3, T. E. Glover2, P. A. Heimann2, J. C. Kieffer3, and R. W. Schoenlein1
1Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California, USA
2Advanced Light Source Division, Lawrence Berkeley National Laboratory, Berkeley, California, USA
3Université du Québec, INRS énergie et matériaux, Varennes, Québec, Canada

Received 11 January 2005; published 5 August 2005

We report on the first demonstration of femtosecond x-ray absorption spectroscopy, made uniquely possible by the use of broadly tunable bending-magnet radiation from “laser-sliced” electron bunches within a synchrotron storage ring. We measure the femtosecond electronic rearrangements that occur during the photoinduced insulator-metal phase transition in VO2. Symmetry- and element-specific x-ray absorption from V2p and O1s core levels (near 500 eV) separately measures the filling dynamics of differently hybridized V3d-O2p electronic bands near the Fermi level.

© 2005 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.95.067405
DOI:
10.1103/PhysRevLett.95.067405
PACS:
78.70.Dm, 78.47.+p

*To whom correspondence should be addressed.

Electronic address: a.cavalleri1@physics.ox.ac.uk

 
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