Phys. Rev. Lett. 96, 117404 (2006) [4 pages]Polarization Dependence of L- and M-Edge Resonant Inelastic X-Ray Scattering in Transition-Metal CompoundsReceived 19 December 2005; published 23 March 2006 The resonant inelastic x-ray scattering (RIXS) cross section at the L and M edges of transition-metal compounds is studied using an effective scattering operator. The intensities of the elastic peak and for spin-flip processes are derived. It is shown how the polarization dependence can be used to select transitions. Comparisons are made with experiment. A detailed analysis of the polarization and angular dependence of L- and M-edge RIXS for divalent copper compounds, such as the high-Tc superconductors, is given. © 2006 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevLett.96.117404
DOI:
10.1103/PhysRevLett.96.117404
PACS:
78.70.Ck, 61.10.Dp, 71.27.+a
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