Phys. Rev. Lett. 96, 200401 (2006) [4 pages]

Identification and Distance Measures of Measurement Apparatus

Abstract

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Citing Articles (13)

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Zhengfeng Ji^*, Yuan Feng^†, Runyao Duan^‡, and Mingsheng Ying^§
State Key Laboratory of Intelligent Technology and Systems, Department of Computer Science and Technology, Tsinghua University, Beijing 100084, China

Received 16 January 2006; revised 5 April 2006; published 22 May 2006

We propose simple schemes that can perfectly identify projective measurement apparatuses secretly chosen from a finite set. Entanglement is used in these schemes both to make possible the perfect identification and to improve the efficiency significantly. Based on these results, a brief discussion on the problem of how to appropriately define distance measures of measurements is also provided.

URL:

http://link.aps.org/doi/10.1103/PhysRevLett.96.200401

DOI:

10.1103/PhysRevLett.96.200401

PACS:

03.65.Ta, 03.65.Ud, 03.67.−a

^*Electronic address: jizhengfeng98@mails.tsinghua.edu.cn

^†Electronic address: feng-y@tsinghua.edu.cn

^‡Electronic address: dry02@mails.tsinghua.edu.cn

^§Electronic address: yingmsh@tsinghua.edu.cn

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Phys. Rev. Lett. 96, 200401 (2006) [4 pages]

Identification and Distance Measures of Measurement Apparatus