Phys. Rev. Lett. 96, 205506 (2006) [4 pages]Full Recovery of Electron Damage in Glass at Ambient TemperaturesReceived 23 November 2005; published 26 May 2006 An unusually complete recovery of extensive electron-beam-induced damage in a thin film of a CaO-Al2O3-SiO2 glass was discovered. Nanoscale measurements show that the Ca ions migrate about 10 nm away during irradiation and return during recovery. Oxygen atoms are trapped largely as molecular oxygen and do not migrate. Electron energy loss measurements demonstrate that the glass returns completely to the original compositional and structural state thus indicating that the glass is in a deep thermodynamic energy minimum. © 2006 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevLett.96.205506
DOI:
10.1103/PhysRevLett.96.205506
PACS:
61.43.Fs, 61.80.Fe, 61.82.Rx, 68.37.Lp
|
|
About | Terms and Conditions | Subscriptions | Search | Help
Use of the American Physical Society websites and journals implies that the user has read and agrees to our Terms and Conditions and any applicable Subscription Agreement. Physical Review®, Physical Review Letters®, Reviews of Modern Physics®, and Physical Review Special Topics® are trademarks of the American Physical Society.