corner
corner

Phys. Rev. Lett. 97, 235502 (2006) [4 pages]

X-Ray Bragg Diffraction in Asymmetric Backscattering Geometry

Download: PDF (300 kB) Buy this article Export: BibTeX or EndNote (RIS)

Yu. V. Shvyd’ko*
Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA

M. Lerche
University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA
Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA

U. Kuetgens
Physikalisch-Technische Bundesanstalt (PTB), Braunschweig, D-38116 Germany

H. D. Rüter
Institut für Experimentalphysik, Universität Hamburg, D-22761 Germany

A. Alatas and J. Zhao
Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA

Received 9 May 2006; published 8 December 2006

We observe three effects in the Bragg diffraction of x rays in backscattering geometry from asymmetrically cut crystals. First, exact Bragg backscattering takes place not at normal incidence to the reflecting atomic planes. Second, a well-collimated (≃1  μrad) beam is transformed after the Bragg reflection into a strongly divergent beam (230  μrad) with reflection angle dependent on x-ray wavelength—an effect of angular dispersion. The asymmetrically cut crystal thus behaves like an optical prism, dispersing an incident collimated polychromatic beam. The dispersion rate is ≃8.5  mrad/eV. Third, parasitic Bragg reflections accompanying Bragg backreflection are suppressed. These effects offer a radically new means for monochromatization of x rays not limited by the intrinsic width of the Bragg reflection.

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.97.235502
DOI:
10.1103/PhysRevLett.97.235502
PACS:
61.10.−i, 41.50.+h, 42.25.Fx

*Email address: shvydko@aps.anl.gov