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Phys. Rev. Lett. 97, 256404 (2006) [4 pages]

Critical Fidelity at the Metal-Insulator Transition

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Gim Seng Ng1,2, Joshua Bodyfelt1, and Tsampikos Kottos1,2
1Department of Physics, Wesleyan University, Middletown, Connecticut 06459, USA
2Max-Planck-Institute for Dynamics and Self-Organization, Bunsenstraße 10, D-37073 Göttingen, Germany

Received 23 August 2006; published 20 December 2006

Using a Wigner Lorentzian random matrix ensemble, we study the fidelity, F(t), of systems at the Anderson metal-insulator transition, subject to small perturbations that preserve the criticality. We find that there are three decay regimes as perturbation strength increases: the first two are associated with a Gaussian and an exponential decay, respectively, and can be described using linear response theory. For stronger perturbations F(t) decays algebraically as F(t)∼t-D2μ, where D2μ is the correlation dimension of the local density of states.

© 2006 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.97.256404
DOI:
10.1103/PhysRevLett.97.256404
PACS:
71.30.+h, 03.65.Yz, 05.45.Mt