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Phys. Rev. Lett. 97, 046103 (2006) [4 pages]

Two-Stage Rotation Mechanism for Group-V Precursor Dissociation on Si(001)

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Jian-Tao Wang1, Changfeng Chen2, E. G. Wang1, Ding-Sheng Wang1, H. Mizuseki3, and Y. Kawazoe3
1Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100080, China
2Department of Physics, University of Nevada, Las Vegas, Nevada 89154, USA
3Institute for Materials Research, Tohoku University, Sendai, 980-8577, Japan

Received 13 March 2006; published 26 July 2006

We report ab initio identification of initial dissociation pathways for Sb4 and Bi4 tetramer precursors on Si(001). We reveal a two-stage double piecewise rotation mechanism for the tetramer to ad-dimer conversion involving two distinct pathways: one along the surface dimer row via a rhombus intermediate state and the other across the surface dimer row via a rotated rhombus intermediate state. These two-stage double piecewise rotation processes play a key role in lowering the kinetic barrier by establishing and maintaining energetically favorable bonding between adatoms and substrate atoms. These results provide an excellent account for experimental observations and elucidate their underlying atomistic origin that may offer useful insights for other surface reaction processes.

© 2006 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.97.046103
DOI:
10.1103/PhysRevLett.97.046103
PACS:
68.65.−k, 68.35.Fx, 68.43.Bc, 81.07.−b