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Phys. Rev. Lett. 97, 083601 (2006) [4 pages]

X-Ray Microprobe of Orbital Alignment in Strong-Field Ionized Atoms

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Received 15 May 2006; published 21 August 2006

We have developed a synchrotron-based, time-resolved x-ray microprobe to investigate optical strong-field processes at intermediate intensities (1014–1015  W/cm2). This quantum-state specific probe has enabled the direct observation of orbital alignment in the residual ion produced by strong-field ionization of krypton atoms via resonant, polarized x-ray absorption. We found strong alignment to persist for a period long compared to the spin-orbit coupling time scale (6.2 fs). The observed degree of alignment can be explained by models that incorporate spin-orbit coupling. The methodology is applicable to a wide range of problems.

© 2006 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.97.083601
DOI:
10.1103/PhysRevLett.97.083601
PACS:
42.50.Hz, 32.80.Rm, 41.60.Ap

*Electronic address: young@anl.gov