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Phys. Rev. Lett. 97, 084802 (2006) [4 pages]

Single-Shot Spectrometry for X-Ray Free-Electron Lasers

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Makina Yabashi1,5,*, Jerome B. Hastings2, Max S. Zolotorev3, Hidekazu Mimura4, Hirokatsu Yumoto4, Satoshi Matsuyama4, Kazuto Yamauchi4, and Tetsuya Ishikawa1,5
1SPring-8/JASRI, Kouto 1-1-1, Sayo, Hyogo 679-5198, Japan
2Stanford Synchrotron Radiation Laboratory/SLAC, Menlo Park, California 94025, USA
3Center for Beam Physics, Accelerator and Fusion Research Division, Lawrence Berkeley National Laboratory, University of California, Berkeley, California 94720, USA
4Department of Precision Science and Technology, Graduate School of Engineering, University of Osaka, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
5SPring-8/RIKEN, Kouto 1-1-1, Sayo, Hyogo 679-5148, Japan

Received 24 May 2006; published 25 August 2006

An experimental scheme to realize single-shot spectrometry for the diagnostics of x-ray free-electron lasers (XFELs) is presented. The combination of an ultraprecisely figured mirror and a perfect crystal form a simple, high-precision spectrometer that can cover an energy range from a few eV to a hundred eV with high resolution. The application of the spectrometer to determine XFEL pulse widths was investigated theoretically and experimentally. It has been shown that the present system can determine pulse widths from sub-fs to ps in a single shot even for spontaneous radiation. The system can be easily extended to even shorter pulses.

© 2006 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.97.084802
DOI:
10.1103/PhysRevLett.97.084802
PACS:
41.50.+h, 07.85.Qe, 42.50.Ar

*Electronic address: yabashi@spring8.or.jp

 
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