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Phys. Rev. Lett. 98, 117206 (2007) [4 pages]

Microscopic and Macroscopic Signatures of Antiferromagnetic Domain Walls

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R. Jaramillo1, T. F. Rosenbaum1,*, E. D. Isaacs2, O. G. Shpyrko2, P. G. Evans3, G. Aeppli4, and Z. Cai5
1The James Franck Institute and Department of Physics, The University of Chicago, Chicago, Illinois 60637, USA
2Center for Nanoscale Materials, Argonne National Laboratory, Argonne, Illinois 60439, USA
3Department of Materials Science and Engineering, University of Wisconsin, Madison, Wisconsin 53706, USA
4London Centre for Nanotechnology and Department of Physics and Astronomy, UCL, London, WC1E 6BT, United Kingdom
5Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA

Received 13 November 2006; published 16 March 2007

Magnetotransport measurements on small single crystals of Cr, the elemental antiferromagnet, reveal the hysteretic thermodynamics of the domain structure. The temperature dependence of the transport coefficients is directly correlated with the real-space evolution of the domain configuration as recorded by x-ray microprobe imaging, revealing the effect of antiferromagnetic domain walls on electron transport. A single antiferromagnetic domain wall interface resistance is deduced to be of order 5×10-5  μΩ cm2 at a temperature of 100 K.

© 2007 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.98.117206
DOI:
10.1103/PhysRevLett.98.117206
PACS:
75.50.Ee, 72.20.My, 73.90.+f, 75.60.Ch

*Electronic address: t-rosenbaum@uchicago.edu

 
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