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Phys. Rev. Lett. 99, 134801 (2007) [4 pages]

Using Compound Kinoform Hard-X-Ray Lenses to Exceed the Critical Angle Limit

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K. Evans-Lutterodt*, A. Stein, J. M. Ablett, and N. Bozovic
Brookhaven National Laboratory, Upton, New York 11973, USA

A. Taylor and D. M. Tennant
Lucent Technologies, 600 Mountain Avenue, Murray Hill, New Jersey 07974, USA

Received 9 January 2007; published 28 September 2007

We have fabricated and tested a compound lens consisting of an array of four kinoform lenses for hard x-ray photons of 11.3 keV. Our data demonstrate that it is possible to exceed the critical angle limit by using multiple lenses, while retaining lens function, and this suggests a route to practical focusing optics for hard x-ray photons with nanometer scale resolution and below.

© 2007 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.99.134801
DOI:
10.1103/PhysRevLett.99.134801
PACS:
41.50.+h, 07.85.Tt

*Corresponding author.

kenne@bnl.gov

Present address: San Jose State University, San Jose, CA 95192, USA.

Present address: Cornell Nanofabrication Facility, Ithaca, NY 14850, USA.

See Also

Comment: Werner Jark, Comment on “Using Compound Kinoform Hard-X-Ray Lenses to Exceed the Critical Angle Limit”, Phys. Rev. Lett. 101, 219501 (2008).

Reply: K. Evans-Lutterodt, A. Stein, N. Bozovic, A. Taylor, and D. M. Tennant, Evans-Lutterodt et al. Reply:, Phys. Rev. Lett. 101, 219502 (2008).