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Phys. Rev. Lett. 99, 155502 (2007) [4 pages]

Structural Basis for the Conducting Interface between LaAlO3 and SrTiO3

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P. R. Willmott1,*, S. A. Pauli1, R. Herger1, C. M. Schlepütz1, D. Martoccia1, B. D. Patterson1, B. Delley1, R. Clarke2, D. Kumah2, C. Cionca2, and Y. Yacoby3
1Paul Scherrer Institut, CH-5232 Villigen, Switzerland
2Randall Laboratory of Physics and FOCUS Center, University of Michigan, Ann Arbor, Michigan 48109-1120, USA
3Racah Institute of Physics, Hebrew University, Jerusalem, 91904, Israel

Received 6 June 2007; published 9 October 2007

The complete atomic structure of a five-monolayer film of LaAlO3 on SrTiO3 has been determined for the first time by surface x-ray diffraction in conjunction with the coherent Bragg rod analysis phase-retrieval method and further structural refinement. Cationic mixing at the interface results in dilatory distortions and the formation of metallic La1-xSrxTiO3. By invoking electrostatic potential minimization, the ratio of Ti4+/Ti3+ across the interface was determined, from which the lattice dilation could be quantitatively explained using ionic radii considerations. The correctness of this model is supported by density functional theory calculations. Thus, the formation of a quasi-two-dimensional electron gas in this system is explained, based on structural considerations.

© 2007 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.99.155502
DOI:
10.1103/PhysRevLett.99.155502
PACS:
68.35.Ct, 61.10.Nz, 71.15.Mb, 72.20.−i

*philip.willmott@psi.ch