Phys. Rev. Lett. 99, 164801 (2007) [4 pages]Benchmarking of Electro-Optic Monitors for Femtosecond Electron BunchesReceived 26 June 2007; published 17 October 2007 The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the Coulomb field of the bunch and a radio-frequency structure transforming the charge distribution into a transverse streak. A comparison permits an absolute calibration of the EO technique. EO signals as short as 60 fs (rms) have been observed, which is a new record in the EO detection of single electron bunches and close to the limit given by the EO material properties. © 2007 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevLett.99.164801
DOI:
10.1103/PhysRevLett.99.164801
PACS:
41.75.Ht, 41.60.Cr, 41.85.Ew, 42.65.Re
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