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Phys. Rev. Lett. 99, 196404 (2007) [4 pages]

Electronic Reconstruction at SrMnO3-LaMnO3 Superlattice Interfaces

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Şerban Smadici1, Peter Abbamonte1, Anand Bhattacharya2, Xiaofang Zhai1, Bin Jiang1, Andrivo Rusydi3, James N. Eckstein1, Samuel D. Bader2, and Jian-Min Zuo1
1Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana, Illinois 61801, USA
2Center for Nanoscale Materials and Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA
3Institute of Applied Physics, University of Hamburg, D-20355 Hamburg, Germany

Received 31 May 2007; published 9 November 2007

We use resonant soft–x-ray scattering (RSXS) to study the electronic reconstruction at the interface between the Mott insulator LaMnO3 and the band insulator SrMnO3. Superlattices of these two insulators were shown previously to have both ferromagnetism and metallic tendencies [ Koida et al. Phys. Rev. B 66 144418 (2002)]. By studying a judiciously chosen superlattice reflection, we show that the interface density of states exhibits a pronounced peak at the Fermi level, similar to that predicted in related titanate superlattices by Okamoto et al. [ Phys. Rev. B 70 241104(R) (2004)]. The intensity of this peak correlates with the conductivity and magnetization, suggesting it is the driver of metallic behavior. Our study demonstrates a general strategy for using RSXS to probe the electronic properties of heterostructure interfaces.

© 2007 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.99.196404
DOI:
10.1103/PhysRevLett.99.196404
PACS:
71.45.Gm, 74.25.Jb, 78.70.Ck