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Phys. Rev. Lett. 99, 213002 (2007) [4 pages]

Photoelectric Effect at Ultrahigh Intensities

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A. A. Sorokin1,2, S. V. Bobashev2, T. Feigl3, K. Tiedtke4, H. Wabnitz4, and M. Richter1
1Physikalisch-Technische Bundesanstalt (PTB), Abbestraße 2-12, D-10587 Berlin, Germany
2Ioffe Physico-Technical Institute, Polytekhnicheskaya 26, 194021 St. Petersburg, Russia
3Fraunhofer Inst. f. Ang. Optik u. Feinm., Albert-Einstein-Straße 7, D-07745 Jena, Germany
4Deutsches Elektronen-Synchrotron (DESY), Notkestraße 85, D-22603 Hamburg, Germany

Received 20 April 2007; published 20 November 2007

In the spectral range of the extreme ultraviolet at a wavelength of 13.3 nm, we have studied the photoionization of xenon at ultrahigh intensities. For our ion mass-to-charge spectroscopy experiments, irradiance levels from 1012 to 1016  W cm-2 were achieved at the new free-electron laser in Hamburg FLASH by strong beam focusing with the aid of a spherical multilayer mirror. Ion charges up to Xe21+ were observed and investigated as a function of irradiance. Our surprising results are discussed in terms of a perturbative and nonperturbative description.

© 2007 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.99.213002
DOI:
10.1103/PhysRevLett.99.213002
PACS:
32.80.Rm, 32.80.Fb, 41.60.Cr, 42.50.Hz