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Phys. Rev. Lett. 99, 096104 (2007) [4 pages]

Partially Wetting Thin Liquid Films: Structure and Dynamics Studied with Coherent X Rays

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C. Gutt1,2,*, M. Sprung3, R. Fendt1, A. Madsen4, S. K. Sinha2, and M. Tolan1
1Experimentelle Physik I, Universität Dortmund, Otto-Hahn Straße 4, D-44221 Dortmund
2Department of Physics, University of California at San Diego, La Jolla, California 92093, USA
3Argonne National Laboratory, 9700 South Cass Avenue, Building 432 E003, Argonne, Illinois 60439, USA
4European Synchrotron Radiation Facility, BP 220, 38043 Grenoble Cedex, France

Received 24 April 2007; published 31 August 2007

We studied the surface structure of thin liquid films vapor deposited on solid substrates in a partial wetting situation by means of coherent x-ray scattering. No dynamics has been observed showing the absence of capillary waves on liquid films partially wetting a substrate. Instead an exponential form of the height-height correlation function has been found pointing toward a solidlike behavior of the thin liquid films at large length scales. The exact surface structure and degree of replication with the substrate depend on the deposition rate of the molecules.

© 2007 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.99.096104
DOI:
10.1103/PhysRevLett.99.096104
PACS:
68.08.Bc, 68.15.+e

*Present address: Hasylab/DESY, Notkestrasse 85, D-22607 Hamburg, Germany.